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NOTE: The Solicitations and topics listed on this site are copies from the various SBIR agency solicitations and are not necessarily the latest and most up-to-date. For this reason, you should visit the respective agency SBIR sites to read the official version of the solicitations and download the appropriate forms and rules.


If no search results for your keyword(s) were found, you are encouraged to review Agency omnibus solicitations for additional funding opportunities. Omnibus solicitations are structured to be broad, extensive Programmatic issuances with research areas related to the petitioning Agency and are not limited to predetermined Topics/Subtopics. If upon reviewing you have additional questions, you may consider reaching out to the respective Agency for clarification regarding acceptable proposals (https://www.sbir.gov/agency-contacts).

  1. 1: Metrology for Materials Purity, Properties, and Provenance

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Open Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  2. 2: Advanced Metrology for Future Microelectronics

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Open Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  3. 3: Enabling Metrology for Integrating Components in Advanced Packaging

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Open Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  4. 4: Modeling and Simulating Semiconductor Materials, Designs, and Components

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Open Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  5. 5: Modeling and Simulating Semiconductor Manufacturing Processes

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Open Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  6. 6: Standardizing New Materials, Processes and Equipment for Microelectronics

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Open Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  7. 7: Metrology to Enhance Security and Provenance of Microelectronic-based Components and Product

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Open Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  8. 1: Near-Real Time RF Propagation Measurement System

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Closed Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  9. 2: Compact, fieldable cryogenics for deployment of superconducting-nanowire single-photon detectors in a circuit-evaluation microscope

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Closed Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  10. 3: Microscope for time-resolved emission microscopy with superconducting-nanowire single-photon detectors

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Closed Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
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