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NOTE: The Solicitations and topics listed on this site are copies from the various SBIR agency solicitations and are not necessarily the latest and most up-to-date. For this reason, you should visit the respective agency SBIR sites to read the official version of the solicitations and download the appropriate forms and rules.

Displaying 17091 - 17100 of 18912 results
  1. DMEA231-005: Vertical Photoconductive Semiconductor Switch (PCSS) and Triggering Assembly

    Release Date: 01-11-2023Open Date: 02-08-2023Due Date: 03-08-2023Close Date: 03-08-2023

    OUSD (R&E) CRITICAL TECHNOLOGY AREA(S): Microelectronics The technology within this topic is restricted under the International Traffic in Arms Regulation (ITAR), 22 CFR Parts 120-130, which controls the export and import of defense-related material and services, including export of sensitive technical data, or the Export Administration Regulation (EAR), 15 CFR Parts 730-774, which controls dual ...

    SBIRPhase I/Phase IIDepartment of DefenseDefense Microelectronics Activity
  2. DMEA231-006: Ultra-Wideband Voltage Controlled Oscillator

    Release Date: 01-11-2023Open Date: 02-08-2023Due Date: 03-08-2023Close Date: 03-08-2023

    OUSD (R&E) CRITICAL TECHNOLOGY AREA(S): Microelectronics The technology within this topic is restricted under the International Traffic in Arms Regulation (ITAR), 22 CFR Parts 120-130, which controls the export and import of defense-related material and services, including export of sensitive technical data, or the Export Administration Regulation (EAR), 15 CFR Parts 730-774, which controls dual ...

    SBIRPhase I/Phase IIDepartment of DefenseDefense Microelectronics Activity
  3. DMEA231-007: SiC Stress Tuning

    Release Date: 01-11-2023Open Date: 02-08-2023Due Date: 03-08-2023Close Date: 03-08-2023

    OUSD (R&E) CRITICAL TECHNOLOGY AREA(S): Microelectronics OBJECTIVE: Mechanical stress tuning through Finite Element Analysis (FEA) modeling that can be used to predict silicon carbide (SiC) wafer warp/strength through processing steps such as power device fabrication, back grinding, stress relief processing, and backside metallization (BSM). DESCRIPTION: Stress engineering can be used for struct ...

    SBIRPhase I/Phase IIDepartment of DefenseDefense Microelectronics Activity
  4. DMEA231-008: Automated Measurement of Passive Devices in Printed Circuit Assemblies

    Release Date: 01-11-2023Open Date: 02-08-2023Due Date: 03-08-2023Close Date: 03-08-2023

    OUSD (R&E) CRITICAL TECHNOLOGY AREA(S): Microelectronics OBJECTIVE: Design and implement a system that would automate the measurement of passive electronic components (capacitors, inductors, and resistors). The components can be measured in place or removed and measured in an automated fashion. DESCRIPTION: Manual measurement of passive devices requires a large amount of human resources to comp ...

    SBIRPhase I/Phase IIDepartment of DefenseDefense Microelectronics Activity
  5. DMEA231-D01: Low Cost, High Power, Opening and Closing Switches

    Release Date: 01-11-2023Open Date: 02-08-2023Due Date: 03-08-2023Close Date: 03-08-2023

    OUSD (R&E) CRITICAL TECHNOLOGY AREA(S): Microelectronics, Directed Energy The technology within this topic is restricted under the International Traffic in Arms Regulation (ITAR), 22 CFR Parts 120-130, which controls the export and import of defense-related material and services, including export of sensitive technical data, or the Export Administration Regulation (EAR), 15 CFR Parts 730-774, whi ...

    SBIRPhase I/Phase IIDepartment of DefenseDefense Microelectronics Activity
  6. DMEA231-D02: Ultra-High Voltage Insulated Gate Bipolar Transistor on Silicon Carbide

    Release Date: 01-11-2023Open Date: 02-08-2023Due Date: 03-08-2023Close Date: 03-08-2023

    OUSD (R&E) CRITICAL TECHNOLOGY AREA(S): Microelectronics The technology within this topic is restricted under the International Traffic in Arms Regulation (ITAR), 22 CFR Parts 120-130, which controls the export and import of defense-related material and services, including export of sensitive technical data, or the Export Administration Regulation (EAR), 15 CFR Parts 730-774, which controls dual ...

    SBIRPhase I/Phase IIDepartment of DefenseDefense Microelectronics Activity
  7. MDA23-001: Expendable Ship Launched Sensor

    Release Date: 01-11-2023Open Date: 02-08-2023Due Date: 03-08-2023Close Date: 03-08-2023

    OUSD (R&E) CRITICAL TECHNOLOGY AREA(S): Integrated Network Systems-of-Systems The technology within this topic is restricted under the International Traffic in Arms Regulation (ITAR), 22 CFR Parts 120-130, which controls the export and import of defense-related material and services, including export of sensitive technical data, or the Export Administration Regulation (EAR), 15 CFR Parts 730-774, ...

    SBIRPhase I/Phase IIDepartment of DefenseMissile Defense Agency
  8. MDA23-002: Federation Playback and Restart

    Release Date: 01-11-2023Open Date: 02-08-2023Due Date: 03-08-2023Close Date: 03-08-2023

    OUSD (R&E) CRITICAL TECHNOLOGY AREA(S): Space Technology; Integrated Network Systems-of-Systems; Trusted AI and Autonomy OBJECTIVE: Develop a minimally invasive simulation playback and restart capability for simulation federations. DESCRIPTION: Extremely useful capabilities within some simulations are playback and restart. In both cases, a simulation saves critical state data during executi ...

    SBIRPhase I/Phase IIDepartment of DefenseMissile Defense Agency
  9. MDA23-003: CdZnTe Impurity and Te-Precipitate Defect Reduction

    Release Date: 01-11-2023Open Date: 02-08-2023Due Date: 03-08-2023Close Date: 03-08-2023

    OUSD (R&E) CRITICAL TECHNOLOGY AREA(S): Microelectronics The technology within this topic is restricted under the International Traffic in Arms Regulation (ITAR), 22 CFR Parts 120-130, which controls the export and import of defense-related material and services, including export of sensitive technical data, or the Export Administration Regulation (EAR), 15 CFR Parts 730-774, which controls dual ...

    SBIRPhase I/Phase IIDepartment of DefenseMissile Defense Agency
  10. MDA23-004: CdZnTe Large Ampoule and Crucible Improvement

    Release Date: 01-11-2023Open Date: 02-08-2023Due Date: 03-08-2023Close Date: 03-08-2023

    OUSD (R&E) CRITICAL TECHNOLOGY AREA(S): Microelectronics The technology within this topic is restricted under the International Traffic in Arms Regulation (ITAR), 22 CFR Parts 120-130, which controls the export and import of defense-related material and services, including export of sensitive technical data, or the Export Administration Regulation (EAR), 15 CFR Parts 730-774, which controls dual ...

    SBIRPhase I/Phase IIDepartment of DefenseMissile Defense Agency
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