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NOTE: The Solicitations and topics listed on this site are copies from the various SBIR agency solicitations and are not necessarily the latest and most up-to-date. For this reason, you should visit the respective agency SBIR sites to read the official version of the solicitations and download the appropriate forms and rules.

Displaying 18911 - 18920 of 19117 results
  1. 7: Metrology to Enhance Security and Provenance of Microelectronic-based Components and Product

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Open Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  2. 1: Near-Real Time RF Propagation Measurement System

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Closed Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  3. 2: Compact, fieldable cryogenics for deployment of superconducting-nanowire single-photon detectors in a circuit-evaluation microscope

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Closed Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  4. 3: Microscope for time-resolved emission microscopy with superconducting-nanowire single-photon detectors

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Closed Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  5. 4: Device-Scale AFM-Thermoreflectance Hybrid Metrology

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Closed Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  6. 5: Super-resolution beam scanning, wide bandwidth, optical photothermal infrared (O-PTIR) microscope.

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Closed Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  7. 6: High brightness compact X-ray or EUV sources for semiconductor metrology

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Closed Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  8. 7: Nanoscale dimensional metrology reference standards to support semiconductor metrology

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Closed Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  9. 8: Advanced Electron Backscatter Diffraction (EBSD) detector offering high pixel density, high-speed and low noise operation, and low kV detection enabled by directly detecting electrons using an application specific integrated circuit (ASIC) detector

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Closed Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
  10. 9: TEM High Voltage Biasing Holder

    Release Date: 04-16-2024Open Date: 04-16-2024Due Date: 06-14-2024Close Date: 06-14-2024

    Closed Topic Title

    SBIRPhase I/Phase IIDepartment of CommerceNational Institute of Standards and Technology
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